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Test Probe B for IP2X Testing with Jointed Test Finger According to IEC60529

Test Probe B for IP2X Testing with Jointed Test Finger According to IEC60529

    • Test Probe B for IP2X Testing with Jointed Test Finger According to IEC60529
    • Test Probe B for IP2X Testing with Jointed Test Finger According to IEC60529
  • Test Probe B for IP2X Testing with Jointed Test Finger According to IEC60529

    Product Details:

    Place of Origin: China
    Brand Name: Pego Tester
    Certification: Third-Lab Calibration Certificate
    Model Number: Test Probe B

    Payment & Shipping Terms:

    Minimum Order Quantity: 1 piece
    Price: USD300~USD400
    Packaging Details: carton
    Delivery Time: 7 working days
    Payment Terms: T/T, Western Union, MoneyGram
    Supply Ability: 100 pieces/month
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    Detailed Product Description
    Standard: IEC60529, IEC61032 Material: Metal And Insulating Material
    Type: With 10N Thruster And Without Thruster Package: Carton
    Shippment: By Express

    Test Probe B

    Introduction:

    Design according to IEC61032 figure 2, meet the requirements of UL507, UL1278 figure 8 and EN60529 figure 2. This probe is intended to verify the basic protection against access to hazardous parts. It is used to verify the protection against access with finger.

     

    Specification:

    Diameter of dactylogryposis: 12mm Length of dactylogryposis: 80mm
    Diameter of baffle: 50mm Length of baffle: 100mm  
    Material: Insulating material (baffle and handle), metal(dactylogryposis)

     

    Picture:

    Test Probe B for IP2X Testing with Jointed Test Finger According to IEC60529 

    Contact Details
    Pego Group (HK) Company Limited

    Contact Person: Ms. Alice

    Tel: 86-0795-3560528

    Fax: 86-0795-3560528

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